Stand: 21.6.2021, 15:37
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Stand: 21.6.2021, 15:37
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Vol |
Jahr |
No. |
Seiten |
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|---|---|---|---|---|---|---|---|---|---|---|
| F. Lasagni | A. Lasagni, M. Engstler, H. P. Degischer, F. Mücklich | „Nano-characterization of Cast Structures by FIB-Tomography“ | Advanced Engineering Materials | 10 | 2008 | 1 | 62-66 | DOI: 10.1002/adem.200700249 | PDF verfügbar | published |
|
| F. Lasagni | A. Lasagni, C. Holzapfel, F. Mücklich, H. P. Degischer | „Three Dinemsional Characterization of Unmodified and Sr-Modified Al-Si Eutectics by FIB and FIB EDX Tomography“ | Advanced Engineering Materials | 8 | 2006 | 8 | 719-723 | DOI: 10.1002/adem.200500276 | PDF verfügbar | published |
|
